Picard, Lewis R B and Mark, Manfred J and Ferlaino, Francesca and van Bijnen, Rick (2019) Deep learning-assisted classification of site-resolved quantum gas microscope images. Measurement Science and Technology, 31 (2). 025201. ISSN 0957-0233
Picard_2020_Meas._Sci._Technol._31_025201.pdf - Published Version
Download (1MB)
Abstract
We present a novel method for the analysis of quantum gas microscope images, which uses deep learning to improve the fidelity with which lattice sites can be classified as occupied or unoccupied. Our method is especially suited to addressing the case of imaging without continuous cooling, in which the accuracy of existing threshold-based reconstruction methods is limited by atom motion and low photon counts. We devise two neural network architectures which are both able to improve upon the fidelity of threshold-based methods, following training on large data sets of simulated images. We evaluate these methods on simulations of a free-space erbium quantum gas microscope, and a noncooled ytterbium microscope in which atoms are pinned in a deep lattice during imaging. In some conditions we see reductions of up to a factor of two in the reconstruction error rate, representing a significant step forward in our efforts to implement high fidelity noncooled site-resolved imaging.
Item Type: | Article |
---|---|
Subjects: | EP Archives > Computer Science |
Depositing User: | Managing Editor |
Date Deposited: | 10 Jul 2023 04:16 |
Last Modified: | 10 Oct 2023 05:23 |
URI: | http://research.send4journal.com/id/eprint/2481 |